Capacitance tomography measurement with USB interface [electronic resource] /
Thesis (Sarjana Kejuruteraan (Elektrik)) - Universiti Teknologi Malaysia, 2006
| প্রধান লেখক: | |
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| বিন্যাস: | |
| ভাষা: | eng |
| প্রকাশিত: |
Skudai : Universiti Teknologi Malaysia,
2006
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| বিষয়গুলি: |
| _version_ | 1826438643797983232 |
|---|---|
| author | 451519 Tee, Zhen Cong |
| author_facet | 451519 Tee, Zhen Cong |
| author_sort | 451519 Tee, Zhen Cong |
| collection | OCEAN |
| description | Thesis (Sarjana Kejuruteraan (Elektrik)) - Universiti Teknologi Malaysia, 2006 |
| first_indexed | 2024-03-05T09:03:20Z |
| format | |
| id | KOHA-OAI-TEST:411238 |
| institution | Universiti Teknologi Malaysia - OCEAN |
| language | eng |
| last_indexed | 2024-03-05T09:03:20Z |
| publishDate | 2006 |
| publisher | Skudai : Universiti Teknologi Malaysia, |
| record_format | dspace |
| spelling | KOHA-OAI-TEST:4112382020-12-19T17:14:21ZCapacitance tomography measurement with USB interface [electronic resource] / 451519 Tee, Zhen Cong Skudai : Universiti Teknologi Malaysia,2006engThesis (Sarjana Kejuruteraan (Elektrik)) - Universiti Teknologi Malaysia, 2006FEELECTLTomographyImage reconstructionArtificial neural networks |
| spellingShingle | Tomography Image reconstruction Artificial neural networks 451519 Tee, Zhen Cong Capacitance tomography measurement with USB interface [electronic resource] / |
| title | Capacitance tomography measurement with USB interface [electronic resource] / |
| title_full | Capacitance tomography measurement with USB interface [electronic resource] / |
| title_fullStr | Capacitance tomography measurement with USB interface [electronic resource] / |
| title_full_unstemmed | Capacitance tomography measurement with USB interface [electronic resource] / |
| title_short | Capacitance tomography measurement with USB interface [electronic resource] / |
| title_sort | capacitance tomography measurement with usb interface electronic resource |
| topic | Tomography Image reconstruction Artificial neural networks |
| work_keys_str_mv | AT 451519teezhencong capacitancetomographymeasurementwithusbinterfaceelectronicresource |