Skip to content
VuFind
English
Deutsch
Español
Français
Italiano
日本語
Nederlands
Português
Português (Brasil)
中文(简体)
中文(繁體)
Türkçe
עברית
Gaeilge
Cymraeg
Ελληνικά
Català
Euskara
Русский
Čeština
Suomi
Svenska
polski
Dansk
slovenščina
اللغة العربية
বাংলা
Galego
Tiếng Việt
Hrvatski
हिंदी
Հայերէն
Українська
Sámegiella
Монгол
Language
All Fields
Title
Author
Subject
Call Number
ISBN/ISSN
Tag
Find
Advanced
An analysis of the characteris...
Cite this
Text this
Email this
Print
Export Record
Export to RefWorks
Export to EndNoteWeb
Export to EndNote
Permanent link
An analysis of the characteristics of insulated-gate thin-film transistors /
Show other versions (1)
40
Bibliographic Details
Main Authors:
235533 Borkan, Harold
,
Weimer, Paul K.
Format:
Subjects:
Thin film transistors
Holdings
Description
Other Versions (1)
Similar Items
Staff View
Showing
1 - 1
results of
1
Show all versions (2)
Search Result 1
An analysis of the characteristics of insulated-gate thin-film transistors /
by
235533 Borkan, Harold
,
Weimer, Paul K.
Show all versions (2)
Similar Items
An analysis of the characteristics of insulated-gate thin-film transistors /
by: 235533 Borkan, Harold, et al.
Thin-film transistor /
by: Kagan, Cherie R., 1969, et al.
Published: (2003)
Thin film transistor circuits and systems /
by: Chaji, Reza, et al.
Published: (2013)
Mobility and threshold voltages comparison of zinc nitride-based thin-film transistor fabricated on Si and glass
by: Sachin Surve, et al.
Published: (2020-01-01)
Characteristics of Offset Corbino Thin Film Transistor: A Physical Model
by: Jiaquan Kong, et al.
Published: (2023-05-01)