Modeling of electrical, process and temperature variations in metal-oxide-semiconductor transistor mismatch [electronic resource] /

Modeling of electrical, process and temperature variations in metal-oxide-semiconductor transistor mismatch [electronic resource] /

Thesis (Sarjana Kejuruteraan (Elektrik)) - Universiti Teknologi Malaysia, 2009

Bibliographic Details
Main Authors:	Muhamad Amri Ismail, 1978-, Fakulti Kejuruteraan Elektrik
Format:
Language:	eng
Published:	2009
Subjects:	Metal oxide semiconductors

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