Lock-in thermography : basics and use for evaluating electronic devices and materials /
Includes bibliographical references (p. 235-244) and index.
| Main Authors: | , , |
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| Format: | |
| Language: | eng |
| Published: |
Heidelberg ; New York : Springer,
c201
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| Subjects: |
| _version_ | 1796735260997713920 |
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| author | 513749 Breitenstein, O. Warta, W. Langenkamp, M. |
| author_facet | 513749 Breitenstein, O. Warta, W. Langenkamp, M. |
| author_sort | 513749 Breitenstein, O. |
| collection | OCEAN |
| description | Includes bibliographical references (p. 235-244) and index. |
| first_indexed | 2024-03-05T10:17:18Z |
| format | |
| id | KOHA-OAI-TEST:435864 |
| institution | Universiti Teknologi Malaysia - OCEAN |
| language | eng |
| last_indexed | 2024-03-05T10:17:18Z |
| publishDate | c201 |
| publisher | Heidelberg ; New York : Springer, |
| record_format | dspace |
| spelling | KOHA-OAI-TEST:4358642020-12-19T17:15:40ZLock-in thermography : basics and use for evaluating electronic devices and materials / 513749 Breitenstein, O. Warta, W. Langenkamp, M. Heidelberg ; New York : Springer,c2010engIncludes bibliographical references (p. 235-244) and index.PSZJBLElectronic apparatus and appliancesElectronic apparatus and appliancesSemiconductorsThermographyURN:ISBN:9783642024160 |
| spellingShingle | Electronic apparatus and appliances Electronic apparatus and appliances Semiconductors Thermography 513749 Breitenstein, O. Warta, W. Langenkamp, M. Lock-in thermography : basics and use for evaluating electronic devices and materials / |
| title | Lock-in thermography : basics and use for evaluating electronic devices and materials / |
| title_full | Lock-in thermography : basics and use for evaluating electronic devices and materials / |
| title_fullStr | Lock-in thermography : basics and use for evaluating electronic devices and materials / |
| title_full_unstemmed | Lock-in thermography : basics and use for evaluating electronic devices and materials / |
| title_short | Lock-in thermography : basics and use for evaluating electronic devices and materials / |
| title_sort | lock in thermography basics and use for evaluating electronic devices and materials |
| topic | Electronic apparatus and appliances Electronic apparatus and appliances Semiconductors Thermography |
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