Structural dynamics of electronic and photonic systems /
"The proposed book will offer comprehensive and versatile methodologies and recommendations on how to determine dynamic characteristics of typical micro- and opto-electronic structural elements (printed circuit boards, solder joints, heavy devices, etc.) and how to design a viable and reliable...
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| Language: | eng |
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Hoboken, N.J. : Wiley,
2011
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| _version_ | 1796735291294220288 |
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| author | Suhir, Ephraim Yu, T. X. (Tongxi), 1941- Connally, Eric |
| author_facet | Suhir, Ephraim Yu, T. X. (Tongxi), 1941- Connally, Eric |
| author_sort | Suhir, Ephraim |
| collection | OCEAN |
| description | "The proposed book will offer comprehensive and versatile methodologies and recommendations on how to determine dynamic characteristics of typical micro- and opto-electronic structural elements (printed circuit boards, solder joints, heavy devices, etc.) and how to design a viable and reliable structure that would be able to withstand high-level dynamic loading"-- |
| first_indexed | 2024-03-05T10:17:45Z |
| format | |
| id | KOHA-OAI-TEST:436014 |
| institution | Universiti Teknologi Malaysia - OCEAN |
| language | eng |
| last_indexed | 2024-03-05T10:17:45Z |
| publishDate | 2011 |
| publisher | Hoboken, N.J. : Wiley, |
| record_format | dspace |
| spelling | KOHA-OAI-TEST:4360142020-12-19T17:15:40ZStructural dynamics of electronic and photonic systems / Suhir, Ephraim Yu, T. X. (Tongxi), 1941- Connally, Eric Hoboken, N.J. : Wiley,2011eng"The proposed book will offer comprehensive and versatile methodologies and recommendations on how to determine dynamic characteristics of typical micro- and opto-electronic structural elements (printed circuit boards, solder joints, heavy devices, etc.) and how to design a viable and reliable structure that would be able to withstand high-level dynamic loading"--"The proposed book will offer comprehensive and versatile methodologies and recommendations on how to determine dynamic characteristics of typical micro- and opto-electronic structural elements (printed circuit boards, solder joints, heavy devices, etc.) and how to design a viable and reliable structure that would be able to withstand high-level dynamic loading. Particular attention will be given to portable devices and systems designed for operation in harsh environments (such as automotive, aerospace, military, etc.) In-depth discussion from a mechanical engineer's viewpoint will be conducted to the key components' level as well as the whole device level. Both theoretical (analytical and computer-aided) and experimental methods of analysis will be addressed. The authors will identify how the failure control parameters (e.g. displacement, strain and stress) of the vulnerable components may be affected by the external vibration or shock loading, as well as by the internal parameters of the infrastructure of the device. Guidelines for material selection, effective protection and test methods will be developed for engineering practice"--"The proposed book will offer comprehensive and versatile methodologies and recommendations on how to determine dynamic characteristics of typical micro- and opto-electronic structural elements (printed circuit boards, solder joints, heavy devices, etc.) and how to design a viable and reliable structure that would be able to withstand high-level dynamic loading"--"The proposed book will offer comprehensive and versatile methodologies and recommendations on how to determine dynamic characteristics of typical micro- and opto-electronic structural elements (printed circuit boards, solder joints, heavy devices, etc.) and how to design a viable and reliable structure that would be able to withstand high-level dynamic loading. Particular attention will be given to portable devices and systems designed for operation in harsh environments (such as automotive, aerospace, military, etc.) In-depth discussion from a mechanical engineer's viewpoint will be conducted to the key components' level as well as the whole device level. Both theoretical (analytical and computer-aided) and experimental methods of analysis will be addressed. The authors will identify how the failure control parameters (e.g. displacement, strain and stress) of the vulnerable components may be affected by the external vibration or shock loading, as well as by the internal parameters of the infrastructure of the device. Guidelines for material selection, effective protection and test methods will be developed for engineering practice"--PSZJBLElectronic apparatus and appliancesOptoelectronic devicesFault tolerance (Engineering)MicrostructureStructural dynamicsURN:ISBN:9780470250020 (hbk.) |
| spellingShingle | Electronic apparatus and appliances Optoelectronic devices Fault tolerance (Engineering) Microstructure Structural dynamics Suhir, Ephraim Yu, T. X. (Tongxi), 1941- Connally, Eric Structural dynamics of electronic and photonic systems / |
| title | Structural dynamics of electronic and photonic systems / |
| title_full | Structural dynamics of electronic and photonic systems / |
| title_fullStr | Structural dynamics of electronic and photonic systems / |
| title_full_unstemmed | Structural dynamics of electronic and photonic systems / |
| title_short | Structural dynamics of electronic and photonic systems / |
| title_sort | structural dynamics of electronic and photonic systems |
| topic | Electronic apparatus and appliances Optoelectronic devices Fault tolerance (Engineering) Microstructure Structural dynamics |
| work_keys_str_mv | AT suhirephraim structuraldynamicsofelectronicandphotonicsystems AT yutxtongxi1941 structuraldynamicsofelectronicandphotonicsystems AT connallyeric structuraldynamicsofelectronicandphotonicsystems |