Amplitude modulation atomic force microscopy /
Includes bibliographical references (p. 139-173) and index.
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Format: | |
Language: | eng |
Published: |
Weinheim : Wiley-VCH ; Chichester : John Wiley [distributor],
2010
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Subjects: |
Summary: | Includes bibliographical references (p. 139-173) and index. |
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