Amplitude modulation atomic force microscopy /

Includes bibliographical references (p. 139-173) and index.

Bibliographic Details
Main Author: Castro Garca̕, Ricardo
Format:
Language:eng
Published: Weinheim : Wiley-VCH ; Chichester : John Wiley [distributor], 2010
Subjects:
Description
Summary:Includes bibliographical references (p. 139-173) and index.