The design and construction of a computerised seebeck effect measurement system for thin-film semiconductor
Project Paper (Sarjana Muda Sains (Fizik Industri)) - Universiti Teknologi Malaysia, 2010
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| Language: | eng |
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2010
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| _version_ | 1826444027007860736 |
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| author | Adel Eskandar Samsudin, 1989- Abd. Khamim Ismail Fakulti Sains |
| author_facet | Adel Eskandar Samsudin, 1989- Abd. Khamim Ismail Fakulti Sains |
| author_sort | Adel Eskandar Samsudin, 1989- |
| collection | OCEAN |
| description | Project Paper (Sarjana Muda Sains (Fizik Industri)) - Universiti Teknologi Malaysia, 2010 |
| first_indexed | 2024-03-05T10:22:00Z |
| format | |
| id | KOHA-OAI-TEST:437424 |
| institution | Universiti Teknologi Malaysia - OCEAN |
| language | eng |
| last_indexed | 2024-03-05T10:22:00Z |
| publishDate | 2010 |
| record_format | dspace |
| spelling | KOHA-OAI-TEST:4374242020-12-19T17:15:44ZThe design and construction of a computerised seebeck effect measurement system for thin-film semiconductor Adel Eskandar Samsudin, 1989- Abd. Khamim Ismail Fakulti Sains 2010engProject Paper (Sarjana Muda Sains (Fizik Industri)) - Universiti Teknologi Malaysia, 2010Includes bibliographical referencesFSL |
| spellingShingle | Adel Eskandar Samsudin, 1989- Abd. Khamim Ismail Fakulti Sains The design and construction of a computerised seebeck effect measurement system for thin-film semiconductor |
| title | The design and construction of a computerised seebeck effect measurement system for thin-film semiconductor |
| title_full | The design and construction of a computerised seebeck effect measurement system for thin-film semiconductor |
| title_fullStr | The design and construction of a computerised seebeck effect measurement system for thin-film semiconductor |
| title_full_unstemmed | The design and construction of a computerised seebeck effect measurement system for thin-film semiconductor |
| title_short | The design and construction of a computerised seebeck effect measurement system for thin-film semiconductor |
| title_sort | design and construction of a computerised seebeck effect measurement system for thin film semiconductor |
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