Electromigration in ULSI Interconnections /
Includes bibliographical references and index
| Main Author: | |
|---|---|
| Format: | |
| Language: | eng |
| Published: |
Singapore ; Hackensack, NJ : World Scientific,
c201
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| Subjects: |
| _version_ | 1796735720552923136 |
|---|---|
| author | Tan, Cher Ming, 1959- |
| author_facet | Tan, Cher Ming, 1959- |
| author_sort | Tan, Cher Ming, 1959- |
| collection | OCEAN |
| description | Includes bibliographical references and index |
| first_indexed | 2024-03-05T10:23:49Z |
| format | |
| id | KOHA-OAI-TEST:438018 |
| institution | Universiti Teknologi Malaysia - OCEAN |
| language | eng |
| last_indexed | 2024-03-05T10:23:49Z |
| publishDate | c201 |
| publisher | Singapore ; Hackensack, NJ : World Scientific, |
| record_format | dspace |
| spelling | KOHA-OAI-TEST:4380182020-12-19T17:15:46ZElectromigration in ULSI Interconnections / Tan, Cher Ming, 1959- Singapore ; Hackensack, NJ : World Scientific,c2010engIncludes bibliographical references and indexPSZJBLIntegrated circuitsElectrodiffusionURN:ISBN:9789814273329 (hbk.)URN:ISBN:9814273325 |
| spellingShingle | Integrated circuits Electrodiffusion Tan, Cher Ming, 1959- Electromigration in ULSI Interconnections / |
| title | Electromigration in ULSI Interconnections / |
| title_full | Electromigration in ULSI Interconnections / |
| title_fullStr | Electromigration in ULSI Interconnections / |
| title_full_unstemmed | Electromigration in ULSI Interconnections / |
| title_short | Electromigration in ULSI Interconnections / |
| title_sort | electromigration in ulsi interconnections |
| topic | Integrated circuits Electrodiffusion |
| work_keys_str_mv | AT tancherming1959 electromigrationinulsiinterconnections |