Electromigration in ULSI Interconnections /

Electromigration in ULSI Interconnections /

Includes bibliographical references and index

Bibliographic Details
Main Author:	Tan, Cher Ming, 1959-
Format:
Language:	eng
Published:	Singapore ; Hackensack, NJ : World Scientific, c201
Subjects:	Integrated circuits Electrodiffusion

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