The effect of layer thickness on the optical properties of cadmium telluride thin film prober by UV-VIS-NIR spectrophotometer /

The effect of layer thickness on the optical properties of cadmium telluride thin film prober by UV-VIS-NIR spectrophotometer /

Project Paper (Sarjana Muda Sains (Fizik Bahan)) - Universiti Teknologi Malaysia, 2010

Bibliographic Details
Main Authors:	Chong, Yin Wei, 1987-, Bakar Ismail, supervisor, Fakulti Sains
Format:
Language:	eng
Published:	2010

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