Accelerating test, validation and debug of high speed serial interfaces /
Includes bibliographical references and index.
| Main Author: | |
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| Format: | |
| Language: | eng |
| Published: |
New York : Springer,
2011
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| Subjects: |
| _version_ | 1826446672159309824 |
|---|---|
| author | 515204 Fan, Yongquan |
| author_facet | 515204 Fan, Yongquan |
| author_sort | 515204 Fan, Yongquan |
| collection | OCEAN |
| description | Includes bibliographical references and index. |
| first_indexed | 2024-03-05T11:00:20Z |
| format | |
| id | KOHA-OAI-TEST:450174 |
| institution | Universiti Teknologi Malaysia - OCEAN |
| language | eng |
| last_indexed | 2024-03-05T11:00:20Z |
| publishDate | 2011 |
| publisher | New York : Springer, |
| record_format | dspace |
| spelling | KOHA-OAI-TEST:4501742020-12-19T17:16:21ZAccelerating test, validation and debug of high speed serial interfaces / 515204 Fan, Yongquan New York : Springer,2011engIncludes bibliographical references and index.PSZJBLInterface circuitsVery high speed integrated circuitsURN:ISBN:9789048193974 (hardcover : alk. paper) |
| spellingShingle | Interface circuits Very high speed integrated circuits 515204 Fan, Yongquan Accelerating test, validation and debug of high speed serial interfaces / |
| title | Accelerating test, validation and debug of high speed serial interfaces / |
| title_full | Accelerating test, validation and debug of high speed serial interfaces / |
| title_fullStr | Accelerating test, validation and debug of high speed serial interfaces / |
| title_full_unstemmed | Accelerating test, validation and debug of high speed serial interfaces / |
| title_short | Accelerating test, validation and debug of high speed serial interfaces / |
| title_sort | accelerating test validation and debug of high speed serial interfaces |
| topic | Interface circuits Very high speed integrated circuits |
| work_keys_str_mv | AT 515204fanyongquan acceleratingtestvalidationanddebugofhighspeedserialinterfaces |