Reliability of nanoscale circuits and systems : methodologies and circuit architectures /

Reliability of nanoscale circuits and systems : methodologies and circuit architectures /

Includes bibliographical references (p. 177-190) and index

Bibliographic Details
Main Authors: 515324 Stanisavljevic, Milos, Schmid, Alexandre, Leblebici, Yusuf
Format:
Language:eng
Published: New York : Springer, 2011
Subjects:
Nanoelectromechanical systems
Nanoelectronics
Description
Summary:Includes bibliographical references (p. 177-190) and index

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