Reliability of nanoscale circuits and systems : methodologies and circuit architectures /
Includes bibliographical references (p. 177-190) and index
Main Authors: | 515324 Stanisavljevic, Milos, Schmid, Alexandre, Leblebici, Yusuf |
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Format: | |
Sprog: | eng |
Udgivet: |
New York : Springer,
2011
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Fag: |
Lignende værker
-
Full-chip nanometer routing techniques /
af: 393058 Ho, Tsung-Yi, et al.
Udgivet: (2007) -
Emerging nanoelectronic devices /
af: Chen, An (Electronics engineer), et al.
Udgivet: (2014) -
Modelling and simulation of nanoscale non-planar double gate metal-oxide-semiconductor field effect transistor /
af: Munawar Agus Riyadi, 1977-, et al.
Udgivet: (2012) -
Electrical transport in nanoscale systems /
af: 373890 Di Ventra, Massimiliano
Udgivet: (2008) -
Modelling and simulation of nanoscale non-planar double gate metal-oxide-semiconductor field effect transist [electronic resource] /
af: Munawar Agus Riyadi, 1977-
Udgivet: (2012)