Reliability of nanoscale circuits and systems : methodologies and circuit architectures /
Includes bibliographical references (p. 177-190) and index
Principais autores: | 515324 Stanisavljevic, Milos, Schmid, Alexandre, Leblebici, Yusuf |
---|---|
Formato: | |
Idioma: | eng |
Publicado em: |
New York : Springer,
2011
|
Assuntos: |
Registros relacionados
-
Full-chip nanometer routing techniques /
por: 393058 Ho, Tsung-Yi, et al.
Publicado em: (2007) -
Emerging nanoelectronic devices /
por: Chen, An (Electronics engineer), et al.
Publicado em: (2014) -
Micro- and nanotechnology sensors, systems, and applications IV : 23-27 April 2012, Baltimore, Maryland, United States /
por: Micro-and nanotechnology sensors, systems and applications (Conference) (4th : 2012 Apr : Baltimore, MD) 546789, et al.
Publicado em: (c201) -
Electrical transport in nanoscale systems /
por: 373890 Di Ventra, Massimiliano
Publicado em: (2008) -
Modelling and simulation of nanoscale non-planar double gate metal-oxide-semiconductor field effect transistor /
por: Munawar Agus Riyadi, 1977-, et al.
Publicado em: (2012)