Reliability of nanoscale circuits and systems : methodologies and circuit architectures /

Includes bibliographical references (p. 177-190) and index

書誌詳細
主要な著者: 515324 Stanisavljevic, Milos, Schmid, Alexandre, Leblebici, Yusuf
フォーマット:
言語:eng
出版事項: New York : Springer, 2011
主題: