Reliability of nanoscale circuits and systems : methodologies and circuit architectures /

Includes bibliographical references (p. 177-190) and index

书目详细资料
Main Authors: 515324 Stanisavljevic, Milos, Schmid, Alexandre, Leblebici, Yusuf
格式:
语言:eng
出版: New York : Springer, 2011
主题: