Characterization and behavior of interfaces : proceedings of Research Symposium on Characterization and Behavior of Interfaces, 21 September 2008, Atlanta, Georgia, USA /

Includes bibliographical references and indexes.

Библиографические подробности
Главные авторы: Frost, J. David, Georgia Institute of Technology
Формат:
Язык:eng
Опубликовано: Amsterdam ; Fairfax, VA : IOS Press, c201
Предметы:
Описание
Итог:Includes bibliographical references and indexes.