Characterization and behavior of interfaces : proceedings of Research Symposium on Characterization and Behavior of Interfaces, 21 September 2008, Atlanta, Georgia, USA /
Includes bibliographical references and indexes.
Main Authors: | Frost, J. David, Georgia Institute of Technology |
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Format: | |
Language: | eng |
Published: |
Amsterdam ; Fairfax, VA : IOS Press,
c201
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Subjects: |
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