Advanced Calculations for Defects in Materials : Electronic Structure Methods /

Advanced Calculations for Defects in Materials : Electronic Structure Methods /

This book investigates the possible ways of improvement by applying more sophisticated electronic structure methods as well as corrections and alternatives to the supercell model. In particular, the merits of hybrid and screened functionals, as well as of the +U methods are assessed in comparison to...

תיאור מלא

מידע ביבליוגרפי
Main Authors: Alkauskas, Audrius, editor 521943, Deák, Peter, editor 634142, Neugebauer, Jörg, editor 634143, Pasquarello, Alfredo, editor 634144, Walle, Chris G. Van de, editor 634145
פורמט: text
שפה:eng
יצא לאור: Weinheim : Wiley-VCH, 2011
נושאים:
Materials
Semiconductors

פריטים דומים

פריטים דומים