Effect of solder bump size on intermetallic compound formation between solder and electroless nickel/electroless palladium/immersion gold (ENEPIG) surface finish [microfilm] /
Project Paper (Sarjana Muda) - Universiti Teknologi Malaysia, 2006
Main Author: | Fakulti Kejuruteraan Mekanikal |
---|---|
Format: | |
Language: | eng |
Published: |
2006
|
Similar Items
-
Effect of solder bump size on intermetallic compound formation between solder and electroless nickel/electroless palladium/immersion gold (ENEPIG) surface finish /
by: 380319 Ching, Sze Pei
Published: (2006) -
Effect of solder volume on interfacial reactions (IMC) on copper and Electroless Nickel / Electroless Palladium/ Immersion Gold (ENEPIG) finishes /
by: 576681 Nor Akmal Fadil, et al.
Published: (2007) -
Effect of solder volume on interfacial reactions (IMC) on copper and Electroless Nickel / Electroless Palladium/ Immersion Gold (ENEPIG) finishes [electronic resource] /
by: 576681 Nor Akmal Fadil
Published: (2007) -
Intermetallics formed between Sn-Ag-Cu solders and electroless nickel/ electroless palladium/ immersion gold surface finish /
by: Lock, Poh Choo, 1987-, et al.
Published: (2010) -
Intermetallics formed between Sn-Ag-Cu solders and electroless nickel/ electroless palladium/ immersion gold surface finish [electronic resource] /
by: Lock, Poh Choo, 1987-
Published: (2010)