Advanced microscopy and spectroscopy techniques for imaging materials with high spatial resolution : November 30-December 4, 2009, Boston, Massachusetts, USA
Includes bibliographical references and index
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| Хэл сонгох: | eng |
| Хэвлэсэн: |
Warrendale, Pa. : Materials Research Society,
c201
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| Нөхцлүүд: |