Optical properties measurements of nanocrystalline silicon thin films /
Thesis (Sarjana Sains (Fizik)) - Universiti Teknologi Malaysia, 2011
| Main Authors: | , , |
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| Language: | eng |
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2011
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| _version_ | 1796743201784070144 |
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| author | Gan, Chee Hong, 1986- Samsudi Sakrani, supervisor Fakulti Sains |
| author_facet | Gan, Chee Hong, 1986- Samsudi Sakrani, supervisor Fakulti Sains |
| author_sort | Gan, Chee Hong, 1986- |
| collection | OCEAN |
| description | Thesis (Sarjana Sains (Fizik)) - Universiti Teknologi Malaysia, 2011 |
| first_indexed | 2024-03-05T12:09:16Z |
| format | |
| id | KOHA-OAI-TEST:473138 |
| institution | Universiti Teknologi Malaysia - OCEAN |
| language | eng |
| last_indexed | 2024-03-05T12:09:16Z |
| publishDate | 2011 |
| record_format | dspace |
| spelling | KOHA-OAI-TEST:4731382020-12-19T17:17:24ZOptical properties measurements of nanocrystalline silicon thin films / Gan, Chee Hong, 1986- Samsudi Sakrani, supervisor Fakulti Sains 2011engThesis (Sarjana Sains (Fizik)) - Universiti Teknologi Malaysia, 2011Includes bibliographical referencesFSLThin filmsNanostructured materials |
| spellingShingle | Thin films Nanostructured materials Gan, Chee Hong, 1986- Samsudi Sakrani, supervisor Fakulti Sains Optical properties measurements of nanocrystalline silicon thin films / |
| title | Optical properties measurements of nanocrystalline silicon thin films / |
| title_full | Optical properties measurements of nanocrystalline silicon thin films / |
| title_fullStr | Optical properties measurements of nanocrystalline silicon thin films / |
| title_full_unstemmed | Optical properties measurements of nanocrystalline silicon thin films / |
| title_short | Optical properties measurements of nanocrystalline silicon thin films / |
| title_sort | optical properties measurements of nanocrystalline silicon thin films |
| topic | Thin films Nanostructured materials |
| work_keys_str_mv | AT gancheehong1986 opticalpropertiesmeasurementsofnanocrystallinesiliconthinfilms AT samsudisakranisupervisor opticalpropertiesmeasurementsofnanocrystallinesiliconthinfilms AT fakultisains opticalpropertiesmeasurementsofnanocrystallinesiliconthinfilms |