Optical properties measurements of nanocrystalline silicon thin films /

Optical properties measurements of nanocrystalline silicon thin films /

Thesis (Sarjana Sains (Fizik)) - Universiti Teknologi Malaysia, 2011

Bibliographic Details
Main Authors:	Gan, Chee Hong, 1986-, Samsudi Sakrani, supervisor, Fakulti Sains
Format:
Language:	eng
Published:	2011
Subjects:	Thin films Nanostructured materials

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