Reliability and materials issues of III-V and II-VI semiconductor optical and electrical devices and materials II : symposium held April 9-13, 2012, San Francisco, California, U.S.A. /

Reliability and materials issues of III-V and II-VI semiconductor optical and electrical devices and materials II : symposium held April 9-13, 2012, San Francisco, California, U.S.A. /

Includes bibliographical references and indexes

Bibliographic Details
Main Authors: Ueda, Osamu 543592, Materials Research Society. Meeting (2012 : San Francisco, Calif.) 543386, Symposium G, "Reliability and Materials Issues of II-VI and III-V Semiconductor Optical and Electron Devices and Materials II" (2012 : San Francisco, Calif.) 543593
Format:
Language:eng
Published: Warrendale, Pa. : Materials Research Society, c201
Subjects:
Materials
Semiconductors
Microelectronics
Description
Summary:Includes bibliographical references and indexes

Similar Items