Reliability and materials issues of III-V and II-VI semiconductor optical and electrical devices and materials II : symposium held April 9-13, 2012, San Francisco, California, U.S.A. /

Reliability and materials issues of III-V and II-VI semiconductor optical and electrical devices and materials II : symposium held April 9-13, 2012, San Francisco, California, U.S.A. /

Includes bibliographical references and indexes

Detalhes bibliográficos
Principais autores:	Ueda, Osamu 543592, Materials Research Society. Meeting (2012 : San Francisco, Calif.) 543386, Symposium G, "Reliability and Materials Issues of II-VI and III-V Semiconductor Optical and Electron Devices and Materials II" (2012 : San Francisco, Calif.) 543593
Formato:
Idioma:	eng
Publicado em:	Warrendale, Pa. : Materials Research Society, c201
Assuntos:	Materials Semiconductors Microelectronics

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