Scanning and transmission electron microscopy : an introduction /

Scanning and transmission electron microscopy : an introduction /

Includes bibliographical references and index.

Bibliografske podrobnosti
Main Authors: Flegler, Stanley L., Heckman, John William, Klomparens, Karen L.
Format:
Jezik:eng
Izdano: New York : Oxford University Press, [199
Teme:
Scanning electron microscopy
Transmission electron microscopy

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