Quantitative data processing in scanning probe microscopy : SPM applications for nanometrology /

PSZJBL

Bibliographic Details
Main Author: Klapetek, Petr
Format:
Language:eng
Published: Amsterdam : William Andrew/Elsevier, 2013
Subjects:
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author Klapetek, Petr
author_facet Klapetek, Petr
author_sort Klapetek, Petr
collection OCEAN
description PSZJBL
first_indexed 2024-03-05T13:08:28Z
format
id KOHA-OAI-TEST:492824
institution Universiti Teknologi Malaysia - OCEAN
language eng
last_indexed 2024-03-05T13:08:28Z
publishDate 2013
publisher Amsterdam : William Andrew/Elsevier,
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spelling KOHA-OAI-TEST:4928242020-12-19T17:18:13ZQuantitative data processing in scanning probe microscopy : SPM applications for nanometrology / Klapetek, Petr Amsterdam : William Andrew/Elsevier,2013engPSZJBLScanning probe microscopyQualitative researchQualitative researchScanning probe microscopyScanning probe microscopy URN:ISBN:9781455730582 (hbk.)
spellingShingle Scanning probe microscopy
Qualitative research
Qualitative research
Scanning probe microscopy
Scanning probe microscopy
Klapetek, Petr
Quantitative data processing in scanning probe microscopy : SPM applications for nanometrology /
title Quantitative data processing in scanning probe microscopy : SPM applications for nanometrology /
title_full Quantitative data processing in scanning probe microscopy : SPM applications for nanometrology /
title_fullStr Quantitative data processing in scanning probe microscopy : SPM applications for nanometrology /
title_full_unstemmed Quantitative data processing in scanning probe microscopy : SPM applications for nanometrology /
title_short Quantitative data processing in scanning probe microscopy : SPM applications for nanometrology /
title_sort quantitative data processing in scanning probe microscopy spm applications for nanometrology
topic Scanning probe microscopy
Qualitative research
Qualitative research
Scanning probe microscopy
Scanning probe microscopy
work_keys_str_mv AT klapetekpetr quantitativedataprocessinginscanningprobemicroscopyspmapplicationsfornanometrology