Quantitative data processing in scanning probe microscopy : SPM applications for nanometrology /
PSZJBL
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Format: | |
Language: | eng |
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Amsterdam : William Andrew/Elsevier,
2013
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_version_ | 1826455487736971264 |
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author | Klapetek, Petr |
author_facet | Klapetek, Petr |
author_sort | Klapetek, Petr |
collection | OCEAN |
description | PSZJBL |
first_indexed | 2024-03-05T13:08:28Z |
format | |
id | KOHA-OAI-TEST:492824 |
institution | Universiti Teknologi Malaysia - OCEAN |
language | eng |
last_indexed | 2024-03-05T13:08:28Z |
publishDate | 2013 |
publisher | Amsterdam : William Andrew/Elsevier, |
record_format | dspace |
spelling | KOHA-OAI-TEST:4928242020-12-19T17:18:13ZQuantitative data processing in scanning probe microscopy : SPM applications for nanometrology / Klapetek, Petr Amsterdam : William Andrew/Elsevier,2013engPSZJBLScanning probe microscopyQualitative researchQualitative researchScanning probe microscopyScanning probe microscopy URN:ISBN:9781455730582 (hbk.) |
spellingShingle | Scanning probe microscopy Qualitative research Qualitative research Scanning probe microscopy Scanning probe microscopy Klapetek, Petr Quantitative data processing in scanning probe microscopy : SPM applications for nanometrology / |
title | Quantitative data processing in scanning probe microscopy : SPM applications for nanometrology / |
title_full | Quantitative data processing in scanning probe microscopy : SPM applications for nanometrology / |
title_fullStr | Quantitative data processing in scanning probe microscopy : SPM applications for nanometrology / |
title_full_unstemmed | Quantitative data processing in scanning probe microscopy : SPM applications for nanometrology / |
title_short | Quantitative data processing in scanning probe microscopy : SPM applications for nanometrology / |
title_sort | quantitative data processing in scanning probe microscopy spm applications for nanometrology |
topic | Scanning probe microscopy Qualitative research Qualitative research Scanning probe microscopy Scanning probe microscopy |
work_keys_str_mv | AT klapetekpetr quantitativedataprocessinginscanningprobemicroscopyspmapplicationsfornanometrology |