Quantitative data processing in scanning probe microscopy : SPM applications for nanometrology /

Quantitative data processing in scanning probe microscopy : SPM applications for nanometrology /

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Detalhes bibliográficos
Autor principal:	Klapetek, Petr
Formato:
Idioma:	eng
Publicado em:	Amsterdam : William Andrew/Elsevier, 2013
Assuntos:	Scanning probe microscopy Qualitative research

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