Quantitative data processing in scanning probe microscopy : SPM applications for nanometrology /

Quantitative data processing in scanning probe microscopy : SPM applications for nanometrology /

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Detalles Bibliográficos
Autor principal: Klapetek, Petr
Formato:
Lenguaje:eng
Publicado: Amsterdam : William Andrew/Elsevier, 2013
Materias:
Scanning probe microscopy
Qualitative research

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