Advances in imaging and electron physics.
This serial covers the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains
| Main Author: | |
|---|---|
| Format: | |
| Language: | eng |
| Published: |
Amsterdam : Academic Press,
2013
|
| Subjects: |
| _version_ | 1796750877700128768 |
|---|---|
| author | Hawkes, P. W., editor |
| author_facet | Hawkes, P. W., editor |
| author_sort | Hawkes, P. W., editor |
| collection | OCEAN |
| description | This serial covers the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains |
| first_indexed | 2024-03-05T13:57:56Z |
| format | |
| id | KOHA-OAI-TEST:509221 |
| institution | Universiti Teknologi Malaysia - OCEAN |
| language | eng |
| last_indexed | 2024-03-05T13:57:56Z |
| publishDate | 2013 |
| publisher | Amsterdam : Academic Press, |
| record_format | dspace |
| spelling | KOHA-OAI-TEST:5092212020-12-19T17:18:51ZAdvances in imaging and electron physics. Hawkes, P. W., editor Amsterdam : Academic Press,2013engThis serial covers the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domainsIncludes bibliographical references and index1. Invariant quantum wave equations and double space-time / Claude Daviau -- 2. In-situ and correlative electron microscopy / Niels de Jonge -- 3. Electron tweezers as a tool for high-precision manipulation of nanoobjects / Vladimir P. Oleshko, James M. Howe -- 4. Robustness analysis of the reduced fuzzy texture spectrum and its performance on noisy images / Pilar Sobrevilla, Eduard Montseny, Aina Barcelo -- 5. Measure-by-wire (MBW) : an automatic control framework for high-throughput transmission electron microscopy / Arturo Tejada, Wouter Van den Broek, Arnold J. den DekkerThis serial covers the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domainsPRZSLOptoelectronic devicesOptical data processingURN:ISBN:9780124077003 |
| spellingShingle | Optoelectronic devices Optical data processing Hawkes, P. W., editor Advances in imaging and electron physics. |
| title | Advances in imaging and electron physics. |
| title_full | Advances in imaging and electron physics. |
| title_fullStr | Advances in imaging and electron physics. |
| title_full_unstemmed | Advances in imaging and electron physics. |
| title_short | Advances in imaging and electron physics. |
| title_sort | advances in imaging and electron physics |
| topic | Optoelectronic devices Optical data processing |
| work_keys_str_mv | AT hawkespweditor advancesinimagingandelectronphysics |