Bias temperature instability for devices and circuits /
Includes bibliographical references
Main Author: | |
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Format: | |
Language: | eng |
Published: |
New York : Springer,
2014
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Subjects: |
_version_ | 1796751228828385280 |
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author | Grasser, Tibor, editor |
author_facet | Grasser, Tibor, editor |
author_sort | Grasser, Tibor, editor |
collection | OCEAN |
description | Includes bibliographical references |
first_indexed | 2024-03-05T14:02:57Z |
format | |
id | KOHA-OAI-TEST:510865 |
institution | Universiti Teknologi Malaysia - OCEAN |
language | eng |
last_indexed | 2024-03-05T14:02:57Z |
publishDate | 2014 |
publisher | New York : Springer, |
record_format | dspace |
spelling | KOHA-OAI-TEST:5108652020-12-19T17:18:55ZBias temperature instability for devices and circuits / Grasser, Tibor, editor New York : Springer,2014engIncludes bibliographical referencesPSZJBLTemperature controlSemiconductorsURN:ISBN:9781461479086 |
spellingShingle | Temperature control Semiconductors Grasser, Tibor, editor Bias temperature instability for devices and circuits / |
title | Bias temperature instability for devices and circuits / |
title_full | Bias temperature instability for devices and circuits / |
title_fullStr | Bias temperature instability for devices and circuits / |
title_full_unstemmed | Bias temperature instability for devices and circuits / |
title_short | Bias temperature instability for devices and circuits / |
title_sort | bias temperature instability for devices and circuits |
topic | Temperature control Semiconductors |
work_keys_str_mv | AT grassertiboreditor biastemperatureinstabilityfordevicesandcircuits |