Atomic force microscopy (AFM) : principles, modes of operation and limitations /
Includes bibliographical references and index
| Format: | |
|---|---|
| Language: | eng |
| Published: |
Hauppauge, New York : Nova Science Publishers, Inc.c
2014
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| Subjects: |
| _version_ | 1796751955338461184 |
|---|---|
| collection | OCEAN |
| description | Includes bibliographical references and index |
| first_indexed | 2024-03-05T14:13:03Z |
| format | |
| id | KOHA-OAI-TEST:514181 |
| institution | Universiti Teknologi Malaysia - OCEAN |
| language | eng |
| last_indexed | 2024-03-05T14:13:03Z |
| publishDate | 2014 |
| publisher | Hauppauge, New York : Nova Science Publishers, Inc.c |
| record_format | dspace |
| spelling | KOHA-OAI-TEST:5141812020-12-19T17:19:05ZAtomic force microscopy (AFM) : principles, modes of operation and limitations /Hauppauge, New York : Nova Science Publishers, Inc.c2014engIncludes bibliographical references and indexPSZJBLScanning force microscopy Atomic force microscopesURN:ISBN:9781631171727 |
| spellingShingle | Scanning force microscopy Atomic force microscopes Atomic force microscopy (AFM) : principles, modes of operation and limitations / |
| title | Atomic force microscopy (AFM) : principles, modes of operation and limitations / |
| title_full | Atomic force microscopy (AFM) : principles, modes of operation and limitations / |
| title_fullStr | Atomic force microscopy (AFM) : principles, modes of operation and limitations / |
| title_full_unstemmed | Atomic force microscopy (AFM) : principles, modes of operation and limitations / |
| title_short | Atomic force microscopy (AFM) : principles, modes of operation and limitations / |
| title_sort | atomic force microscopy afm principles modes of operation and limitations |
| topic | Scanning force microscopy Atomic force microscopes |