Trace-based post-silicon validation for VLSI circuits /

Includes bibliographical references (p.103-106) and index

Bibliographic Details
Main Authors: Liu, Xiao, Xu, Qiang
Format:
Language:eng
Published: New York : Springer , c201
Subjects:
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author Liu, Xiao
Xu, Qiang
author_facet Liu, Xiao
Xu, Qiang
author_sort Liu, Xiao
collection OCEAN
description Includes bibliographical references (p.103-106) and index
first_indexed 2024-03-05T14:19:53Z
format
id KOHA-OAI-TEST:516407
institution Universiti Teknologi Malaysia - OCEAN
language eng
last_indexed 2024-03-05T14:19:53Z
publishDate c201
publisher New York : Springer ,
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spelling KOHA-OAI-TEST:5164072020-12-19T17:19:11ZTrace-based post-silicon validation for VLSI circuits / Liu, Xiao Xu, Qiang New York : Springer ,c2014engIncludes bibliographical references (p.103-106) and indexPSZKLLIntegrated circuitsIntegrated circuitsURN:ISBN:9783319005324 (hbk.)
spellingShingle Integrated circuits
Integrated circuits
Liu, Xiao
Xu, Qiang
Trace-based post-silicon validation for VLSI circuits /
title Trace-based post-silicon validation for VLSI circuits /
title_full Trace-based post-silicon validation for VLSI circuits /
title_fullStr Trace-based post-silicon validation for VLSI circuits /
title_full_unstemmed Trace-based post-silicon validation for VLSI circuits /
title_short Trace-based post-silicon validation for VLSI circuits /
title_sort trace based post silicon validation for vlsi circuits
topic Integrated circuits
Integrated circuits
work_keys_str_mv AT liuxiao tracebasedpostsiliconvalidationforvlsicircuits
AT xuqiang tracebasedpostsiliconvalidationforvlsicircuits