Physical and chemical characterization of oxide/germanium interfaces in ge mosfet [electronic resource] /

Project Paper (Sarjana Muda Kejuruteraan Sistem Elektronik) - Universiti Teknologi Malaysia, 2015

Bibliographic Details
Main Authors: Nur Shazwani Yunus, 1992-, Satoru Matsumoto, supervisor, Institut Teknologi Antarabangsa Malaysia-Jepun
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Language:eng
Published: 2015
Subjects:
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author Nur Shazwani Yunus, 1992-
Satoru Matsumoto, supervisor
Institut Teknologi Antarabangsa Malaysia-Jepun
author_facet Nur Shazwani Yunus, 1992-
Satoru Matsumoto, supervisor
Institut Teknologi Antarabangsa Malaysia-Jepun
author_sort Nur Shazwani Yunus, 1992-
collection OCEAN
description Project Paper (Sarjana Muda Kejuruteraan Sistem Elektronik) - Universiti Teknologi Malaysia, 2015
first_indexed 2024-03-05T15:07:22Z
format
id KOHA-OAI-TEST:532137
institution Universiti Teknologi Malaysia - OCEAN
language eng
last_indexed 2024-03-05T15:07:22Z
publishDate 2015
record_format dspace
spelling KOHA-OAI-TEST:5321372020-12-19T17:20:03ZPhysical and chemical characterization of oxide/germanium interfaces in ge mosfet [electronic resource] / Nur Shazwani Yunus, 1992- Satoru Matsumoto, supervisor Institut Teknologi Antarabangsa Malaysia-Jepun 2015engProject Paper (Sarjana Muda Kejuruteraan Sistem Elektronik) - Universiti Teknologi Malaysia, 2015Includes bibliographical referencesPSZJBLMetal oxide semiconductor field-effect transistors
spellingShingle Metal oxide semiconductor field-effect transistors
Nur Shazwani Yunus, 1992-
Satoru Matsumoto, supervisor
Institut Teknologi Antarabangsa Malaysia-Jepun
Physical and chemical characterization of oxide/germanium interfaces in ge mosfet [electronic resource] /
title Physical and chemical characterization of oxide/germanium interfaces in ge mosfet [electronic resource] /
title_full Physical and chemical characterization of oxide/germanium interfaces in ge mosfet [electronic resource] /
title_fullStr Physical and chemical characterization of oxide/germanium interfaces in ge mosfet [electronic resource] /
title_full_unstemmed Physical and chemical characterization of oxide/germanium interfaces in ge mosfet [electronic resource] /
title_short Physical and chemical characterization of oxide/germanium interfaces in ge mosfet [electronic resource] /
title_sort physical and chemical characterization of oxide germanium interfaces in ge mosfet electronic resource
topic Metal oxide semiconductor field-effect transistors
work_keys_str_mv AT nurshazwaniyunus1992 physicalandchemicalcharacterizationofoxidegermaniuminterfacesingemosfetelectronicresource
AT satorumatsumotosupervisor physicalandchemicalcharacterizationofoxidegermaniuminterfacesingemosfetelectronicresource
AT institutteknologiantarabangsamalaysiajepun physicalandchemicalcharacterizationofoxidegermaniuminterfacesingemosfetelectronicresource