Die level defect classification using region-based convolutional neural network /

Bibliographic Details
Main Authors:	Kwong, Ming You, 1991-, author 607349, Usman Ullah Sheikh, supervisor 640629, Fakulti Kejuruteraan Elektrik 540663
Format:	text
Language:	eng
Published:	Johor Bahru, Johor : Universiti Teknologi Malaysia, 2017
Subjects:	Semiconductors Defection

Die level defect classification using region-based convolutional neural network / by Kwong, Ming You, 1991-, author 607349

Published 2017

text