Die level defect classification using region-based convolutional neural network /

Die level defect classification using region-based convolutional neural network /

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Detalles Bibliográficos
Autores principales: Kwong, Ming You, 1991-, author 607349, Usman Ullah Sheikh, supervisor 640629, Fakulti Kejuruteraan Elektrik 540663
Formato: text
Lenguaje:eng
Publicado: Johor Bahru, Johor : Universiti Teknologi Malaysia, 2017
Materias:
Semiconductors
Defection

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