Die level defect classification using region-based convolutional neural network /

Die level defect classification using region-based convolutional neural network /

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Détails bibliographiques
Auteurs principaux: Kwong, Ming You, 1991-, author 607349, Usman Ullah Sheikh, supervisor 640629, Fakulti Kejuruteraan Elektrik 540663
Format: text
Langue:eng
Publié: Johor Bahru, Johor : Universiti Teknologi Malaysia, 2017
Sujets:
Semiconductors
Defection

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