Audit criticality measurement for EDP applications /
12
| Main Author: | |
|---|---|
| Format: | |
| Subjects: |
| _version_ | 1826365812268597248 |
|---|---|
| author | 257448 Hubbert, James F. |
| author_facet | 257448 Hubbert, James F. |
| author_sort | 257448 Hubbert, James F. |
| collection | OCEAN |
| description | 12 |
| first_indexed | 2024-03-04T15:10:25Z |
| format | |
| id | KOHA-OAI-TEST:53933 |
| institution | Universiti Teknologi Malaysia - OCEAN |
| last_indexed | 2024-03-04T15:10:25Z |
| record_format | dspace |
| spelling | KOHA-OAI-TEST:539332020-12-19T16:58:50ZAudit criticality measurement for EDP applications / 257448 Hubbert, James F. 12PSZJBLElectronic data processing |
| spellingShingle | Electronic data processing 257448 Hubbert, James F. Audit criticality measurement for EDP applications / |
| title | Audit criticality measurement for EDP applications / |
| title_full | Audit criticality measurement for EDP applications / |
| title_fullStr | Audit criticality measurement for EDP applications / |
| title_full_unstemmed | Audit criticality measurement for EDP applications / |
| title_short | Audit criticality measurement for EDP applications / |
| title_sort | audit criticality measurement for edp applications |
| topic | Electronic data processing |
| work_keys_str_mv | AT 257448hubbertjamesf auditcriticalitymeasurementforedpapplications |