Development of automatic test pattern generation /
Project Paper (Sarjana Muda Kejuruteraan (Elektrik - Elektronik)) - Universiti Teknologi Malaysia, 2017
| Main Authors: | , , |
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| Format: | |
| Language: | eng |
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Johor Bahru, Johor : Universiti Teknologi Malaysia,
2017
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| Subjects: |
| _version_ | 1826466217412526080 |
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| author | Tang, Soon Loong, 1993- , author Norlina Paraman, supervisor Fakulti Kejuruteraan Elektrik |
| author_facet | Tang, Soon Loong, 1993- , author Norlina Paraman, supervisor Fakulti Kejuruteraan Elektrik |
| author_sort | Tang, Soon Loong, 1993- , author |
| collection | OCEAN |
| description | Project Paper (Sarjana Muda Kejuruteraan (Elektrik - Elektronik)) - Universiti Teknologi Malaysia, 2017 |
| first_indexed | 2024-03-05T15:45:41Z |
| format | |
| id | KOHA-OAI-TEST:544882 |
| institution | Universiti Teknologi Malaysia - OCEAN |
| language | eng |
| last_indexed | 2024-03-05T15:45:41Z |
| publishDate | 2017 |
| publisher | Johor Bahru, Johor : Universiti Teknologi Malaysia, |
| record_format | dspace |
| spelling | KOHA-OAI-TEST:5448822020-12-19T17:20:35ZDevelopment of automatic test pattern generation / Tang, Soon Loong, 1993- , author Norlina Paraman, supervisor Fakulti Kejuruteraan Elektrik Johor Bahru, Johor : Universiti Teknologi Malaysia,2017engProject Paper (Sarjana Muda Kejuruteraan (Elektrik - Elektronik)) - Universiti Teknologi Malaysia, 2017Bibliography: p. 40-41.FEELECTLElectronic circuitsIntegrated circuit layout |
| spellingShingle | Electronic circuits Integrated circuit layout Tang, Soon Loong, 1993- , author Norlina Paraman, supervisor Fakulti Kejuruteraan Elektrik Development of automatic test pattern generation / |
| title | Development of automatic test pattern generation / |
| title_full | Development of automatic test pattern generation / |
| title_fullStr | Development of automatic test pattern generation / |
| title_full_unstemmed | Development of automatic test pattern generation / |
| title_short | Development of automatic test pattern generation / |
| title_sort | development of automatic test pattern generation |
| topic | Electronic circuits Integrated circuit layout |
| work_keys_str_mv | AT tangsoonloong1993author developmentofautomatictestpatterngeneration AT norlinaparamansupervisor developmentofautomatictestpatterngeneration AT fakultikejuruteraanelektrik developmentofautomatictestpatterngeneration |