Development of automatic test pattern generation /

Development of automatic test pattern generation /

Project Paper (Sarjana Muda Kejuruteraan (Elektrik - Elektronik)) - Universiti Teknologi Malaysia, 2017

Bibliographic Details
Main Authors:	Tang, Soon Loong, 1993- , author, Norlina Paraman, supervisor, Fakulti Kejuruteraan Elektrik
Format:
Language:	eng
Published:	Johor Bahru, Johor : Universiti Teknologi Malaysia, 2017
Subjects:	Electronic circuits Integrated circuit layout

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