ADVANCES IN IMAGING AND ELECTRON PHYSICS.
1. New physical principle for interference of light and material particles Roman Castaneda and Giorgio Matteucci 2. A Review of Scanning Electron Microscopy in Near Field Emission Mode Taryl L. Kirk 3. Nonscalar Mathematical Morphology Jasper van de Gronde and Jos B.T.M. Roerdink 4. Energy Analysing...
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Language: | eng |
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London : Academic Press,
2017
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_version_ | 1826466252224200704 |
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author | Hawkes, P. W.,, editor |
author_facet | Hawkes, P. W.,, editor |
author_sort | Hawkes, P. W.,, editor |
collection | OCEAN |
description | 1. New physical principle for interference of light and material particles Roman Castaneda and Giorgio Matteucci 2. A Review of Scanning Electron Microscopy in Near Field Emission Mode Taryl L. Kirk 3. Nonscalar Mathematical Morphology Jasper van de Gronde and Jos B.T.M. Roerdink 4. Energy Analysing and Energy Selecting Electron Microscopes A.J.F. Metherel |
first_indexed | 2024-03-05T15:46:12Z |
format | |
id | KOHA-OAI-TEST:545054 |
institution | Universiti Teknologi Malaysia - OCEAN |
language | eng |
last_indexed | 2024-03-05T15:46:12Z |
publishDate | 2017 |
publisher | London : Academic Press, |
record_format | dspace |
spelling | KOHA-OAI-TEST:5450542020-12-19T17:20:35ZADVANCES IN IMAGING AND ELECTRON PHYSICS. Hawkes, P. W.,, editor London : Academic Press,2017eng1. New physical principle for interference of light and material particles Roman Castaneda and Giorgio Matteucci 2. A Review of Scanning Electron Microscopy in Near Field Emission Mode Taryl L. Kirk 3. Nonscalar Mathematical Morphology Jasper van de Gronde and Jos B.T.M. Roerdink 4. Energy Analysing and Energy Selecting Electron Microscopes A.J.F. MetherelIncludes bibliographical references and index1. New physical principle for interference of light and material particles Roman Castaneda and Giorgio Matteucci 2. A Review of Scanning Electron Microscopy in Near Field Emission Mode Taryl L. Kirk 3. Nonscalar Mathematical Morphology Jasper van de Gronde and Jos B.T.M. Roerdink 4. Energy Analysing and Energy Selecting Electron Microscopes A.J.F. MetherelPSZJBLImage processingOptoelectronic devicesOptical data processingURN:ISBN:9780128120866 |
spellingShingle | Image processing Optoelectronic devices Optical data processing Hawkes, P. W.,, editor ADVANCES IN IMAGING AND ELECTRON PHYSICS. |
title | ADVANCES IN IMAGING AND ELECTRON PHYSICS. |
title_full | ADVANCES IN IMAGING AND ELECTRON PHYSICS. |
title_fullStr | ADVANCES IN IMAGING AND ELECTRON PHYSICS. |
title_full_unstemmed | ADVANCES IN IMAGING AND ELECTRON PHYSICS. |
title_short | ADVANCES IN IMAGING AND ELECTRON PHYSICS. |
title_sort | advances in imaging and electron physics |
topic | Image processing Optoelectronic devices Optical data processing |
work_keys_str_mv | AT hawkespweditor advancesinimagingandelectronphysics |