Test pattern generator at register transfer level /

Test pattern generator at register transfer level /

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Thesis (Sarjana Kejuruteraan Elektrik (Komputer Dan Sistem Mikroelektronik)) - Universiti Teknologi Malaysia, 2019

Bibliographic Details
Main Authors:	Lim, Yong Shan, 1992-, author, Norlina Paraman, supervisor, Fakulti Kejuruteraan. Sekolah Kejuruteraan Elektrik
Format:
Language:	eng
Published:	Johor Bahru, Johor : Universiti Teknologi Malaysia, 2019
Subjects:	Automatic test pattern generation Electronic circuits

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