Atom Probe Microscopy /

Atom Probe Microscopy /

Includes bibliographical references and index.

Bibliografske podrobnosti
Main Authors:	Gault, Baptiste author 632642, Moody, Michael P. author 632643, Cairney, Julie M. author 632644, Ringer, Simon P. author 632645
Format:	text
Jezik:	eng
Izdano:	New York : Springer, 2012
Teme:	Atomic force microscopy Scanning probe microscopy Atom-probe field ion microscopy

Podobne knjige/članki

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Scanning probe microscopy /
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Applied scanning probe methods XI : scanning probe microscopy techniques /
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Roadmap of scanning probe microscopy /
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Scanning probe microscopies beyond imaging : manipulation of molecules and nanostructures /
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Quantitative data processing in scanning probe microscopy : SPM applications for nanometrology /
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Applied Scanning Probe Methods V [electronic book]: Scanning Probe Microscopy Techniques/
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Dynamic analysis of micro-cantilever dynamic and its probe in Atomic Force Microscopy [electronic resource] /
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Atomic force microscopy in process engineering : introduction to AFM for improved processes and products /
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Atom probe tomography analysis of near surface, low concentration impurities in single crystal silicon
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Atomic force microscopy in liquid : biological applications /
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Applied scanning probe methods VII : biomimetics and industrial applications /
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On-surface stereochemical characterization of a highly curved chiral nanographene by noncontact atomic force microscopy and scanning tunneling microscopy
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