Atom Probe Microscopy /

Atom Probe Microscopy /

Includes bibliographical references and index.

書目詳細資料
Main Authors: Gault, Baptiste author 632642, Moody, Michael P. author 632643, Cairney, Julie M. author 632644, Ringer, Simon P. author 632645
格式: text
語言:eng
出版: New York : Springer, 2012
主題:
Atomic force microscopy
Scanning probe microscopy
Atom-probe field ion microscopy

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