Compact multiport reflectometer for microwave material characterization /

Compact multiport reflectometer for microwave material characterization /

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Thesis (Sarjana Kejuruteraan (Elektronik dan Telekomunikasi)) - Universiti Teknologi Malaysia, 2020

Bibliographic Details
Main Authors:	Elshafiey, Obaidallah Ibrahim Mohamed, 1996-, author 629441, You Kok Yeow, supervisor 501327, Fakulti Kejuruteraan. Sekolah Kejuruteraan Elektrik 619066
Format:
Language:	eng
Published:	Johor Bahru, Johor : Universiti Teknologi Malaysia, 2020
Subjects:	Reflectometer Electronic circuits

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