Compact multiport reflectometer for microwave material characterization /

Thesis (Sarjana Kejuruteraan (Elektronik dan Telekomunikasi)) - Universiti Teknologi Malaysia, 2020

Bibliographic Details
Main Author: Elshafiey, Obaidallah Ibrahim Mohamed, 1996-, author 629441
Format:
Language:eng
Published: Johor Bahru, Johor : Universiti Teknologi Malaysia, 2020
Subjects:
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author Elshafiey, Obaidallah Ibrahim Mohamed, 1996-, author 629441
author_facet Elshafiey, Obaidallah Ibrahim Mohamed, 1996-, author 629441
author_sort Elshafiey, Obaidallah Ibrahim Mohamed, 1996-, author 629441
collection OCEAN
description Thesis (Sarjana Kejuruteraan (Elektronik dan Telekomunikasi)) - Universiti Teknologi Malaysia, 2020
first_indexed 2024-03-05T16:30:15Z
format
id KOHA-OAI-TEST:559582
institution Universiti Teknologi Malaysia - OCEAN
language eng
last_indexed 2024-03-05T16:30:15Z
publishDate 2020
publisher Johor Bahru, Johor : Universiti Teknologi Malaysia,
record_format dspace
spelling KOHA-OAI-TEST:5595822021-08-02T15:02:49ZCompact multiport reflectometer for microwave material characterization / Elshafiey, Obaidallah Ibrahim Mohamed, 1996-, author 629441 Johor Bahru, Johor : Universiti Teknologi Malaysia,2020engThesis (Sarjana Kejuruteraan (Elektronik dan Telekomunikasi)) - Universiti Teknologi Malaysia, 2020Bibliography: p. 65-67.PSZJBLReflectometerElectronic circuits
spellingShingle Reflectometer
Electronic circuits
Elshafiey, Obaidallah Ibrahim Mohamed, 1996-, author 629441
Compact multiport reflectometer for microwave material characterization /
title Compact multiport reflectometer for microwave material characterization /
title_full Compact multiport reflectometer for microwave material characterization /
title_fullStr Compact multiport reflectometer for microwave material characterization /
title_full_unstemmed Compact multiport reflectometer for microwave material characterization /
title_short Compact multiport reflectometer for microwave material characterization /
title_sort compact multiport reflectometer for microwave material characterization
topic Reflectometer
Electronic circuits
work_keys_str_mv AT elshafieyobaidallahibrahimmohamed1996author629441 compactmultiportreflectometerformicrowavematerialcharacterization