Thermal-safe system-on-chip test scheduling using dynamic voltage and frequency scaling /

Thermal-safe system-on-chip test scheduling using dynamic voltage and frequency scaling /

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Bibliographic Details
Main Authors:	Hasliza Hassan 1983-, author 257876, Ooi, Chia Yee supervisor 486773, Fakulti Kejuruteraan Elektrik Sekolah Kejuruteraan Elektrik 540663
Format:	text
Language:	eng
Published:	Johor Bahru, Johor : Universiti Teknologi Malaysia, 2018
Subjects:	Integrated circuits Thermal conductivity

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