Damage mechanics-based model for reliability assessment of through-silicon via interconnects /
| Main Authors: | , , , |
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| Format: | text |
| Language: | eng |
| Published: |
Johor Bahru, Johor : Universiti Teknologi Malaysia,
2020
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| Subjects: | |
| Online Access: | http://dms.library.utm.my:8080 |
| _version_ | 1826471479556964352 |
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| author | Mohammad Amirul Affiz Afripin, 1987-, author 541882 Mohd. Nasir Tamin, supervisor 304103 Nor Akmal Fadil, supervisor 576681 Fakulti Kejuruteraan - Sekolah Kejuruteraan Mekanikal 619080 |
| author_facet | Mohammad Amirul Affiz Afripin, 1987-, author 541882 Mohd. Nasir Tamin, supervisor 304103 Nor Akmal Fadil, supervisor 576681 Fakulti Kejuruteraan - Sekolah Kejuruteraan Mekanikal 619080 |
| author_sort | Mohammad Amirul Affiz Afripin, 1987-, author 541882 |
| collection | OCEAN |
| description | |
| first_indexed | 2024-03-05T17:04:00Z |
| format | text |
| id | KOHA-OAI-TEST:599694 |
| institution | Universiti Teknologi Malaysia - OCEAN |
| language | eng |
| last_indexed | 2024-03-05T17:04:00Z |
| publishDate | 2020 |
| publisher | Johor Bahru, Johor : Universiti Teknologi Malaysia, |
| record_format | dspace |
| spelling | KOHA-OAI-TEST:5996942022-06-21T08:06:56ZDamage mechanics-based model for reliability assessment of through-silicon via interconnects / Mohammad Amirul Affiz Afripin, 1987-, author 541882 Mohd. Nasir Tamin, supervisor 304103 Nor Akmal Fadil, supervisor 576681 Fakulti Kejuruteraan - Sekolah Kejuruteraan Mekanikal 619080 textJohor Bahru, Johor : Universiti Teknologi Malaysia,2020engBibliography: p. 137-152.KK-FK_SKMSubjectSubjecthttp://dms.library.utm.my:8080 |
| spellingShingle | Subject Subject Mohammad Amirul Affiz Afripin, 1987-, author 541882 Mohd. Nasir Tamin, supervisor 304103 Nor Akmal Fadil, supervisor 576681 Fakulti Kejuruteraan - Sekolah Kejuruteraan Mekanikal 619080 Damage mechanics-based model for reliability assessment of through-silicon via interconnects / |
| title | Damage mechanics-based model for reliability assessment of through-silicon via interconnects / |
| title_full | Damage mechanics-based model for reliability assessment of through-silicon via interconnects / |
| title_fullStr | Damage mechanics-based model for reliability assessment of through-silicon via interconnects / |
| title_full_unstemmed | Damage mechanics-based model for reliability assessment of through-silicon via interconnects / |
| title_short | Damage mechanics-based model for reliability assessment of through-silicon via interconnects / |
| title_sort | damage mechanics based model for reliability assessment of through silicon via interconnects |
| topic | Subject Subject |
| url | http://dms.library.utm.my:8080 |
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