Damage mechanics-based model for reliability assessment of through-silicon via interconnects /
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| Format: | text |
| Language: | eng |
| Published: |
Johor Bahru, Johor : Universiti Teknologi Malaysia,
2020
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| Subjects: |
| _version_ | 1796764021663203328 |
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| author | Mohammad Amirul Affiz Afripin, 1987-, author 541882 |
| author_facet | Mohammad Amirul Affiz Afripin, 1987-, author 541882 |
| author_sort | Mohammad Amirul Affiz Afripin, 1987-, author 541882 |
| collection | OCEAN |
| description | |
| first_indexed | 2024-03-05T17:04:00Z |
| format | text |
| id | KOHA-OAI-TEST:599695 |
| institution | Universiti Teknologi Malaysia - OCEAN |
| language | eng |
| last_indexed | 2024-03-05T17:04:00Z |
| publishDate | 2020 |
| publisher | Johor Bahru, Johor : Universiti Teknologi Malaysia, |
| record_format | dspace |
| spelling | KOHA-OAI-TEST:5996952022-05-22T08:38:22ZDamage mechanics-based model for reliability assessment of through-silicon via interconnects / Mohammad Amirul Affiz Afripin, 1987-, author 541882 textJohor Bahru, Johor : Universiti Teknologi Malaysia,2020engBibliography: p. 137-152.KK-FK_SKMSubjectSubject |
| spellingShingle | Subject Subject Mohammad Amirul Affiz Afripin, 1987-, author 541882 Damage mechanics-based model for reliability assessment of through-silicon via interconnects / |
| title | Damage mechanics-based model for reliability assessment of through-silicon via interconnects / |
| title_full | Damage mechanics-based model for reliability assessment of through-silicon via interconnects / |
| title_fullStr | Damage mechanics-based model for reliability assessment of through-silicon via interconnects / |
| title_full_unstemmed | Damage mechanics-based model for reliability assessment of through-silicon via interconnects / |
| title_short | Damage mechanics-based model for reliability assessment of through-silicon via interconnects / |
| title_sort | damage mechanics based model for reliability assessment of through silicon via interconnects |
| topic | Subject Subject |
| work_keys_str_mv | AT mohammadamirulaffizafripin1987author541882 damagemechanicsbasedmodelforreliabilityassessmentofthroughsiliconviainterconnects |