MACHINE VISION INSPECTION SYSTEMS. Volume 2 : Machine Learning-Based Approaches /

MACHINE VISION INSPECTION SYSTEMS. Volume 2 : Machine Learning-Based Approaches /

Includes bibliographical and references

Détails bibliographiques
Auteurs principaux:	Malarvel, Muthukumaran, editor, Nayak, Soumya Ranjan, 1984-, editor, Pattnaik, Prasant Kumar, 1969-, editor, Panda, Surya Narayan, editor
Format:
Langue:	eng
Publié:	Hoboken, New Jersey : John Wiley & Sons, Inc. ; 2021
Sujets:	Computer vision Engineering inspection Image processing

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