MACHINE VISION INSPECTION SYSTEMS. Volume 2 : Machine Learning-Based Approaches /

MACHINE VISION INSPECTION SYSTEMS. Volume 2 : Machine Learning-Based Approaches /

Includes bibliographical and references

Manylion Llyfryddiaeth
Prif Awduron: Malarvel, Muthukumaran, editor, Nayak, Soumya Ranjan, 1984-, editor, Pattnaik, Prasant Kumar, 1969-, editor, Panda, Surya Narayan, editor
Fformat:
Iaith:eng
Cyhoeddwyd: Hoboken, New Jersey : John Wiley & Sons, Inc. ; 2021
Pynciau:
Computer vision
Engineering inspection
Image processing

Eitemau Tebyg